Sandy Bay Campus, Chemistry Building, Level 2, Rooms 217, 255, 256
This facility houses:
Electron Probe Microanalysis (EPMA) and Scanning Electron Microscopy (SEM) are closely related techniques for high-magnification imaging and spatially resolved chemical analysis of solid samples. Their focussed electron beam excites various secondary signals: Secondary electrons (SE) show surface morphology, backscattered electrons (BSE) local differences in mean atomic number, cathodoluminescence (CL) local variation in defect chemistry, x-rays are detected by wavelength and energy dispersive spectrometers (WDS, EDS) for chemical analysis. Whereas SEM is optimized for high-resolution microscopy, EPMA is mainly used for quantitative chemical analysis of micrometer-sized volumes, for which the samples have to be flat and polished. Non-conductive samples have to be coated (C, Au, Pt). Fresh biological specimens can be observed uncoated using the FEI in low vacuum or environmental mode. The microXRF uses a primary x-ray beam and EDS for lower resolution chemical microanalysis.
Contact Dr Karsten Goemann for more information
Authorised by the Deputy Vice-Chancellor (Research)
15 October, 2012