A JEOL JXA-8530F Plus field emission electron microprobe (EPMA) was installed in the CSL in March 2017, one of the first worldwide of the latest generation and the first in Australasia. The instrument combines ultra-high resolution electron imaging with quantitative chemical analysis capabilities of micrometre sized features.
The instrument features a Schottky field emission gun and is equipped with 5 wavelength dispersive spectrometers (WDS), a fully integrated Thermo UltraDry energy dispersive spectrometer (EDS) as well as quartz light optics and an xCLent IV hyperspectral cathodoluminescence system. Probe Software Probe for EPMA is used for quantitative analyses and quantified element maps.
The purchase of the instrument was made possible through a Linkage Infrastructure, Equipment and Facilities (LIEF) grant from the Australian Research Council won by a team of UTAS researchers lead by Prof Leonid Danyushevsky.
Some of the improved capabilities compared to our existing instrumentation are:
- Simultaneous and combined EDS-WDS x-ray microanalysis using EDS for major elements and WDS for minor and trace elements for improved throughput and/or sensitivity.
- Improved WDS x-ray intensities, 10-70% more for most elements, for some element and material combinations up to 300% better.
- Clean vacuum system for improved light element and low accelerating voltage capabilities.
- Hyperspectral cathodoluminescence system. The example image shows the distribution of the 608nm CL emission in a calcite (calcium carbonate) sample. This emission line is commonly associated with Mn2+ incorporation in calcite. "Hotter" colours correspond to higher CL intensity.
Please visit the Electron Microscopy and X-Ray Microanalysis Facility website for further information about the instrument.